e 嘉庚创新实验室

In-Situ Electron Microscopy Platform

The characteristic in-situ electronic microscopy platform includes a variety of sample preparation and microscopic imaging equipment, including ion beam milling systems, double spherical aberration corrected transmission electron microscope (AC-TEM), field emission scanning electron microscope (SEM), etc. These all tools provide hardware support for the study of structure-activity relationship at the atomic and molecular scales which provides ways to explore and improve the performance of new materials.